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《Acta Optica Sinica》 2017-08
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Fabrication and Surface Enhanced Raman Spectroscopy of Nano-Cu_2O Thin Films

Wang Jinxia;Hong Ruijin;Tao Chunxian;Zhang Dawei;School of Optical-Electrical and Computer Engineering,University of Shanghai for Science and Technology;Research Center of Optical Instruments and Systems Engineering,Ministry of Education,Shanghai Key Laboraory of Modern Optical System;  
A series of copper thin films with different thicknesses are fabricated on glass substrates by vacuum electron beam evaporation technology and subsequent thermal oxidation technology.The crystal structure and element compositions of these copper thin films are characterized by X-ray diffraction and X-ray photoelectron spectroscopy,respectively.The absorption spectra and surface enhanced Raman spectroscopy(SERS)activity of these copper thin films are analyzed by using UV-Vis-IR spectroscopy and Raman spectrometer,respectively.With the increase of film thickness,the amorphous state of the annealed thin film samples changes to a polycrystalline state with a preferred orientation in the(111) plane,and the red-shift of absorption edge appears.The single-phase nano-Cu_2O thin films are obtained when the annealing temperature is 200 ℃ and the annealing time is 60 min.The SERS activity increases with the increase of light absorbance of the nano-Cu_2O thin films.
【Fund】: 国家自然科学基金(61378060);; 国家重点研发计划(2016YFB1102300)
【CateGory Index】: O657.37;TB383.2
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