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《Acta Photonica Sinica》 1993-01
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DETERMINATION OF SECONDARY ELECTRON EMISSION MATERIALS CONSTANT ON CHANNEL WALL OF MCP USING EXTREME CONDITIONS

Wang JinxiangXi'an Institute of Opties and Precision Mechanics, Academia Sinica, Xian 7 10068  
The present article shows that the secondary electron emission material constant A on the channel wall of MCP and the average emission potential V0 of the secondary electrons at right angles to the wall can be conveniently determined by means of the measurement of extreme gain of MCP. The determination of A and V0 is usefull to select the materials, structures, and schedules of manufacturing MCP, as well as operating modes of MCP.
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【Citations】
Chinese Journal Full-text Database 1 Hits
1 Bai Weihai Zhang JishengXi'an Institute of Applied optics, Chang'an 710100;FIXED PATTERN NOISE OF MICROCHANNEL PLATE AND ITS TEST CONSIDERATION[J];Acta Photonica Sinica;1993-02
【Co-citations】
Chinese Journal Full-text Database 1 Hits
1 Wang Yu;Chen Qian;Zhang Baomin (School of Electronic Eng. & Optoelectronic Tech., Nanjing Univ. of Sci. & Tech., Nanjing 210094);Real-Time Fixed Pattern Noise Suppressing for LLL Imaging System[J];OPTOELECFRONIC TECHNOLOGY;1999-02
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