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《Acta Photonica Sinica》 2005-01
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Non Destructive Testing of Laser Induced Damage in Optical Thin Films by Laser Photothermal Deflection Image

Tan Hengying,Liu Pengcheng,Shi BaixuanThe State Key Lab. of Modern Optical Instrumentation Zhejiang University,Hangzhou 310027  
The principle testing laser induced damage of optical thin films by laser photothemal deflection method (PTDM) and corresponding experimental testing set up are described. The laser induced damage on surface of optical thin films is tested by scanning surface using the set up. Grey image coded by tested two dimensional photothermal deflection signals is directly displayed and shown that the testing laser induced damage of optical thin films by PTDM possesses many advantages such as direct display of damage and determination of damage threshold. And the method is available.
【Fund】: 国家自然科学基金 (批准号 10 174 0 6 7)资助项目
【CateGory Index】: TB383
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