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《Journal of Shenyang Institute of Aeronautcal Engineering》 2003-01
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Intelligent diagnosis of test diedrawing defects by genetic algorithm

LIU Zhanjun HE Ping CHEN Wei (Shenyang Institute of Aeronantical Engineering,Liaoning Shenyang 10034)  
The defect symptom-reason table of test die-drawing is established.Intelligent diagnosis of test die-drawing defects is conducted Using Genetic Algorithm.The method of improving the defect symptom-reason table of test die-drawing is studied.The diagnosis process by genetic algorithm is described.
【CateGory Index】: TG385.2
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