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The Fast Testing Methods of X-ray Topography for HgCdTe Crystal Defects

Cai Yi, He Yongcheng, Sun Jiankun (Kunming Institute of Physics, Kunming, 650223)  
The two testing methods of X-ray topography for HgCdTe crystal defects are studied in this paper——one is the scanning reflective topography with an X-ray image eye and the other is reflective Laue topography. A scanning reflective topography of HgCdTe sample with a resolution of 50μm can be taken in a few minutes exposure to an X-ray image eye; while a reflective topography with a resolution of 60μm can be taken in 20 minutes exposure to a specific laue camera.
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