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《Infrared Technology》 2007-02
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Research on Distribution Characteristics of the Precipitates on CdZnTe Wafers

WAN Rui-min,HUANG Hui,ZHAO Zeng-lin,CHEN Xue-mei,HU Zan-dong,ZHANG Xiao-wen,JI Rong-bin(Kunming Institute of Physics,Kunming Yunnan 650223,China)  
There are two groups of Cd0.96Zn0.04Te wafers grown on Te-rich,Cd –rich respectively.The precipitates in wafers were observed by transmission infrared microscopy with quasi-confocal system.According to the observed result,there are significant different in shape of precipitate,but the distribution of precipitate density at different size are subject to a exponential decay distribution on two groups of wafers.
【Fund】: 云南省自然科学基金重点项目(2003E0012Z);; 云南省科技创新人才计划(2005PY02-7)
【CateGory Index】: TN304.23
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