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《中国颗粒学报(英文版)》 2007-03
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Atomic resolution in noncontact AFM by probing cantilever frequency shifts

Hong Yong Xie Department of Environmental Engineering, Shanghai Second Polytechnic University, 2360 Jin Hai Road, Pudong Shanghai 201209, China  
Rutile TiO2 (0 0 1) quantum dots (or nano-marks) in different shapes were used to imitate uncleaved material surfaces or materials with rough surfaces. By numerical integration of the equation of motion of cantilever for silicon tip scanning along the [1 1 0] direction over the rutile TiO2 (0 0 1) quantum dots in ultra high vacuum (UHV), scanning routes were explored to achieve atomic resolution from frequency shift image. The tip–surface interaction forces were calculated from Lennard–Jones (12-6) potential by the Hamaker summation method. The calculated results showed that atomic resolution could be achieved by frequency shift image for TiO2 (0 0 1) surfaces of rhombohedral quantum dot scanning in a vertical route, and spherical cap quantum dot scanning in a superposition route.
【CateGory Index】: O611.3
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