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《LASER & INFRARED》 1997-03
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Method for Measuring MTF Using Laser Speckle

With the development of the technology of theory and manufacture in FPA,the technology is used in imagers gradualy. Therefore, it becomes more and more important how to measure the MTF of FPAs in order to assess the performance of imagers. It is a new method for measuring the modulation transfer function (MTF),by using laser speckle, which belongs to the methods for measuring MTF using random targets. This method allows to be used to measure the MTF of FPA. Compared with the traditional methods,it requires neither critical alighment,nor hight quality optical components.One key of this method is how to generate calibratable laser speckle patterns. Another key is the data processing. In this paper, we mainly discussed the two aspects.
【CateGory Index】: TN241
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Chinese Journal Full-text Database 1 Hits
1 Lu Jin Chen Weimin Cen Junbo(College of Optoelectronic Engineering,Chongqing University,Chongqin 400044);Effect of Distance on Modulation Transfer Function of Imaging Sensor Using Rectangle Template Contact Method[J];Acta Optica Sinica;2006-07
China Proceedings of conference Full-text Database 1 Hits
1 LI Hong-zhuang, HAN Chang-yuan, TIAN Yuan, YANG Xiao-fei, WANG Xin, ZHANG Xiaohui (Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Acadmy of Sciences, Changchun 130022, China) (Graduate School of Chinese Academy of Science, Beijing 100049, China);Research of the total MTF measurement of optical instruments using film[A];[C];2005
Chinese Journal Full-text Database 10 Hits
1 CEN Jun-bo,HUANG Shang-lian,CHEN Wei-min,LU Jin(The Key Laboratory for Opto-electronic Technology & System,Chongqing University,Chongqing 400044,China);Preference decision of technical schemes for digital binoculars[J];Opto-electronic Engineering;2005-09
2 CEN Jun-bo,CHEN Wei-min,LU Jin ( Key Laboratory for Optoelectronic Technology & System, Chongqing University, Chongqing 400044,China );Contact measurement using rectangle template for modulation transfer function of image sensor[J];Opto-Electronic Engineering;2006-02
3 WANG Wan li, JIANG Xiao guo, WU Ting lie, QI Shuang xi, TAN Zhao, WANG Wei (Institute of Fluid Physics,CAEP,Mianyang 621900,China);Data Processing Method of Measuring CCD Imaging MTF with Step Sample[J];Journal of Optoelectronics.laser;2002-02
4 DONG Wei, WANG Yue-feng, LI Gang (Ordnance Engineering College, Shijiazhuang\ 050003, China);Shimmer MTF measurement by using Michelson interferometer fringes[J];Optical Technology;2002-04
5 Liu Tiegen Zhang Yimo Li Yuhua (Research Institute of Modern Optical Instruments, Tianjin University, Key Laboratory of Opto Electronics Information Technical Science, Education Ministry of China, Tianjin 300072) Zhu Jingsi (Quality Control Ce;An Evaluation Method for Resolving Power of Photographic Materials Based on Fourier Power Spectrum[J];ACTA OPTICA SINICA;2000-08
6 Hu Song Chen Weimin Wen Zhiyu Yang Guirong Chen Gang Huang Shanglian (College of Opto-Electronic Engineering, Chongqing University, Chongqing 400044);Influence of Photo-Detecter Array on Resolution and Wavelength Accuracy of Spectrometer[J];Acta Optica Sinica;2002-02
7 Yang Hua Jiao Wenchun Zhu Yonghong Liu Ying ( Beijing Institute of Space Machine and Electricity, Beijing 100080) (Received 5 March 2001; revised 4 May 2001);Modulation Transfer Function of CCD Camera at Nyquist Frequency[J];Acta Optica Sinica;2002-03
8 Zhou Jie Qiu Shenggen Liu Xu Li Haifeng (State Key Laboratory of Modern Optical Instrument, Zhejiang University, Hangzhou 310027) (Received 20 November 2002; revised 31 March 2003);Measurement System of Projection Lens Based on CCD Modulation Transfer Function[J];Acta Optica Sinica;2004-02
9 Pang Quan-hua; Dai Hong-wei (The Zhejiang Huadong Optical Instrumenis Pactory,Jiaxing 314001);The Opportunity and Challenge for the Binoculars Industry[J];OPTICAL INSTRUMENTS;1997-S1
10 HUANG Weijia (Shanghai Institute of Optical Instruments, Shanghai 200093);A discussion about measurement method of parallelism of optical axis of binocular telescope[J];OPTICAL INSTRUMENTS;2000-01
【Secondary References】
Chinese Journal Full-text Database 1 Hits
1 He Weiji Chen Qian Qu Huiming Qin Jian(School of Electronic Engineering and Optoelectronics Technology,Nanjing University of Science and Technology,Nanjing,Jiangsu 210094,China);Charge Multiplication of CCD Based on Electrons Multiplication[J];Acta Optica Sinica;2008-06
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