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《LASER & INFRARED》 1997-04
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Linear Scanning Performance of the Resonant Scanners

David G. Tweed (General Scanning Inc., Watertown MA,USA)  
Several experimental apparatuses are proposed and studied for linearizing resonant scanners in imaging systems and inspection systems. A comprehensive comparing among these linearizing schemes are given to show the system designers on choosing suitable methods to linear the resonant scanner in the application systems.
【CateGory Index】: TP334.
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