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《Acta Metrologica Sinica》 2007-03
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General Metrology Software Based on “Layer Metrology Framework”

CUI Xiao-hai,YANG Ri(National Institute of Metrology,Beijing 100013,China)  
To study the problem of automatic control of measuring instruments,a software development method based on "Layer Metrology Framework" is presented,and the restricted conditions are defined.Owing to the program control instruments become more and more specialized and integrated,the metrology engineers waste much more time on develop metrology software,it is always difficult to operate an unfamiliar instrument.The general scope and expansibility of "Layer Metrology Framework"is analyzed,and provides a new method to develop the software for metrology task on metrology instruments control more quickly.A commonly used microwave power metrology software system is designed by this method.
【CateGory Index】: TB9;TP319
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