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《Computer Engineering and Applications》 2010-01
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Low power scan chain architecture based on selective trigger

OUYANG Yi-ming,LIU Juan,LIANG Hua-guo,CHEN Tian College of Computer and Information,Hefei University of Technology,Hefei 230009,China  
This paper presents a new selective trigger scan chain architecture by changing traditional scan design using a scan register,whose length is equal to that of scan chain.It can efficiently reduce dynamic power in shift cycle and increase the scan clock frequency.The test data that the architecture requires is difference test vector set,so a separate CSR(Cyclical Scan Register) isn't required in decompression after encoding lengths of runs of 0s in the test data.Experiment results on ISCAS'89 benchmark circuits show that the proposed technique is more superior to reduce average power during scan test than traditional scan design.
【Fund】: 国家自然科学基金No.60876028 No.60633060;; 安徽省自然科学基金No.090412034;; 博士点基金新教师项目No.200803591033~~
【CateGory Index】: TN47
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【Citations】
Chinese Journal Full-text Database 1 Hits
1 Wang Wei1,2, Han Yinhe2,3, Hu Yu2,3, Li Xiaowei2,3, and Zhang Yousheng11(School of Computer and Information, Hefei University of Technology, Hefei 230009)2(Advanced Test Technology Laboratory, Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100080)3(State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100080);An Effective Low-Power Scan Architecture—PowerCut[J];Journal of Computer Research and Development;2007-03
【Co-citations】
Chinese Journal Full-text Database 1 Hits
1 FANG Fang1,2,3,WANG Wei1,3,WANG Jie1,3,CHEN Tian1,YANG Nian-hong1 (1.School of Computer and Information,Hefei University of Technology,Hefei 230009,China;2.School of Management,Hefei University of Technology,Hefei 230009,China;3.Key Laboratory of Computer System and Architecture,Institute of Computing Technology,Chinese Academy of Sciences,Beijing 100090,China);Research on progress of low-power testing[J];Journal of Hefei University of Technology(Natural Science);2009-06
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