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《Microelectronics》 2003-01
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Design of Boundary-Scan Test Circuits

WANG Zi,LIU Hongmin,WU Dexin(Microelectronics R & D Center, The Chinese Academy of Sciences, Beijing 100029, P R China)  
The design techniques for boundaryscan test circuits are discussed in the paper The boundaryscan architecture at IC level is presented A boundaryscan test circuit for 32:1 MUX used in fiber communication system is designed, and the simulation result of the circuit is provided
【CateGory Index】: TN407
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【References】
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1 Yang Bing Jiang Yanfeng Zhang Dong (Microelectronic Center,College of Information Engineering,North China University of Technology,Beijing 100144,China Beijing Institute of Auto-Testing Technology,Beijing,100088,China);Implementation of Mixed-Signal Integrated Circuits Boundary-Scan Test[A];[C];2009
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【Co-citations】
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1 HU Zhu-bing(Department of Electrical & Electronic Engineering,Chengde Petroleum College,Chengde 067000,Hebei,China);Design of AC Machine Timing System Controlled by Singlechip[J];Journal of Chengde Petroleum College;2008-01
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1 Yang Bing Jiang Yanfeng Zhang Dong (Microelectronic Center,College of Information Engineering,North China University of Technology,Beijing 100144,China Beijing Institute of Auto-Testing Technology,Beijing,100088,China);Implementation of Mixed-Signal Integrated Circuits Boundary-Scan Test[A];[C];2009
2 Zhang Xiaobo Jiang Yanfeng Zhang Dong (Microelectronic Center,College of Information Engineering,North China University of Technology,Beijing 100144,China Beijing Institute of Auto-Testing Technology,Beijing,100088 China);An Specific Design of JTAG IP Core[A];[C];2009
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