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A NEW METHOD FOR MEASUREMENT OF SUB-CIRCUIT'S PARAMETER

Yuan Lu, Yang Wenxia (College of Information Science and Technology, Nankai University, Tianjin, 300071)  
In this paper, a new method for measuring the parameters of sub circuit is introduced. With the aid of calibration, the S parameters of the sub circuit can be measured while the sub circuit need not be separated from the main circuit.$$$$
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