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X-Ray Diffraction Topography Study of Defects in ATGSP Crystals

Dong Shengming Fang Changshui(Institute of Crystal Materials, Shandong University, Jinan, 250100)  
The defects in ATGSP crystal have been studied by means of X-Ray topography. The property of defects, the cause of the defects formation and influence of defects on properties of the crystal were discussed, we found that dispersion of defects in ATGSP crystal is particular It is gathered in region of [010] direction. We have compared topography of ATGSP crystal with topography of TGS crystal and investigated their difference.
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