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《Journal of Synthetic Crystals》 2009-01
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Characterization of Solution-deposited LiMn_2O_4 Thin Films with Different Thickness Heat-treated by Rapid Thermal Annealing

WU Xian-ming1,LI Run-xiu1,HE Ze-qiang1,2,CHEN Shang1(1.College of Chemistry and Chemical Engineering,Jishou University,Jishou 416000,China;2.College of Chemistry and Chemical Engineering,Central South Unversity,Changsha 410083,China)  
LiMn2O4 thin films of different thickness were prepared by solution deposition and rapid thermal annealing.The phase identification and surface morphology were studied by X-ray diffraction and scanning electron microscopy.The electrochemical properties of thin films were carried out by galvanostatic charge-discharge experiments and electrochemical impedance spectroscopy.The films of different thickness are homogeneous with the grain size between 20-50 nm.The cross section of the film is very clear.The film roughness decreases with the increase of film thickness.The specific capacity of the films with different thickness is between 42-47 μAh/(cm2·μm).The capacity loss increases from 0.64% to 9.0% after being cycled 50 times as the thickness of thin film increases from 0.18 μm to 1.04 μm.The diffusion coefficients of lithium ion in the films of different thickness are close with the order of 10-11cm2/s.
【Fund】: 国家自然科学基金项目(No.20873054);; 湖南省教育厅自然科学基金项目(No.07B060)
【CateGory Index】: TM912
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