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《Journal of Synthetic Crystals》 2014-01
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Effects of Film Thickness on the Structural Characteristics and Optical Properties of Ag Nanostructure Thin Films

WANG Li-ping;HAN Pei-de;ZHANG Zhu-xia;XU Bing-she;College of Physics and Optoelectronics,Taiyuan University of Techonlogy;College of Materials Science and Engineering,Taiyuan University of Techonlogy;Key Laboratory of Interface Science and Engineering in Advanced Materials of Ministry of Education Taiyuai University of Technology;  
The structural stability,electric and optical properties of Ag( 111) nanometer thin films were investigated based on DFT. The results show that the films are energetically stabilized when the layer number increases to 13,corresponding to a thickness of about 2. 8 nm. Atom interactions of surface layers appear weak ionic. Changes of distances between layers and surface effect are mainly concentrated in the several surface layers. Analysis of the optical properties of the films showed that their refractive index is significantly increased and their extinction coefficient is slightly increased compared with the bulk at visible and infrared wavelengths. With increasing thin film thickness,the refractive index decreased, while the extinction coefficient and absorption increased.
【Fund】: 国家自然科学基金(51002102);; 太原理工大学青年基金(2012L037)
【CateGory Index】: O484.41
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