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《JOURNAL OF SYNTHETIC CRYSTALS》 1994-01
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A Preeisive Method for Measurement of the Waveguide Parameters──M Line Spectroocopy

Zhuo Zuang He Ming Chen Jun Mu Xiaodong Shao Zongshu(Institute of Crystal Materials ,Shandong University ,Jianan 250100 ,China)Chen Xiaojun (Department of Physics , Nankai Univereity ,Tianjin 300071 ,China)  
In this paper the refractive index of the proton-exchanged LT waveguide and the substrateare measured in a high precision by M line spectral method in the principle of the totalinternal reflection in the prism coupler. The distribution of the refractive index in waveguideis calculated by IWKB methed ,and the surface refractive index of the waveguide is fittedaccording to Fermi formula with the precision as high as 10 ̄(-4).
【CateGory Index】: O7
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