Introduction to Atomic Force Microscope and its Manipulation
Jie Zhu, Runguang Sun (Biophysics Lab, College of Physics and Information Technology, Shaanxi Normal University, Xi’an 710062)
Introduced the basic principles of atomic force microscope (AFM) in detecting the surface shape of samples shortly, and reviewed the properties and functions of the four key components of AFM such as Laser, cantilevers, piezoelectric scanner and photoelectric diode concretely. Expatiated three kinds of running modes of this equipment such as contact mode, non-contact mode and tapping mode in details, and given prominence to the superiority of AFM according to the comparison and analysis between AFM and other surface detectors, and Stressed on the idiographic function of the instrument’s parameter-analysis and data-processing. And the paper ended with the author’s personal constructive suggestions to the improvement and development of this equipment by combining its constitutions and work principle.