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《Journal of Shanghai Jiaotong University》 2013-01
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Soft Error Problem and Countermeasure in Nanometer Scale Integrated Circuits

ZHANG Min-xuan,SUN Yan,SONG Chao(College of Computer,National University of Defense Technology,Changsha 410073,China)  
This paper described the mechanism,trends and evaluation techniques of soft errors in nanometer scale integrated circuits.For solving the soft error problems,the paper summed up the countermeasures across the software level,circuit and architecture-level as well as process device-level.At last,some suggestions on the development of related studies on soft error problems were put forward.
【Fund】: 国家自然科学基金项目(60970036)
【CateGory Index】: TN406
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