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1 |
ZHAO Yue-en (Dean's Office, Postal & Telecommunication School of Hebei, Shijiazhuang Hebei 050031,China);EWP Application in the Oscillating Circuit of Non-sine Wave[J];Journal of Daxian Teachers College;2004-02 |
2 |
Liu Hongyan1 Luan Xiaofeng1 Lai Xinquan2 (1.CPLA 92941 Unit, Huludao 125001;2.Institute of Electronic CAD, Xidian University, Xi'an 710071);Current comparator in peak-value-current-mode-control for DC/DC regulator[J];Electronic Measurement Technology;2008-10 |
3 |
ZHOU Lai-xiu (Department of Physics and Electronic Information Engineering, Hunan City University, Yiyang, Hunan 413000, China);Analysis of the Principal and Subordinate JK Trigger about a Change Phenomenon[J];;2005-02 |
4 |
Liu Yonggen, Feng Yong, Luo Ping, Zhang Bo (University of Electronic Science and Technology of China, Sichuan, 610054, China);A novel current-limited comparator for switching power supply[J];China Integrated Circuit;2007-03 |
5 |
LIU Yan-tao,LUO He-ping,LI Ping(State Key Lab of Electronic Thin Films and Integrated Devices,Univ.of Elec.Sci.& Technol.of China,Chengdu,Sichuan 610054,P.R.China);A New Peak-Current-Mode Control Architecture Based on Sum-Comparator[J];Microelectronics;2007-05 |
6 |
LI Zheng-fa CHEN Li-xing
(Department of Physics, Hubei University of Education, Wuhan Hubei 430060, China; Wuhan No.75 Middle School,Wuhan Hubei 430000,China);Discussion on Secondary Change of Principal and Subordinate JK Trigger[J];Training and Research;2003-02 |
7 |
ZHOU Huan-yin,Lü Zi-yong,MA Gui-zhen(Department of Nuclear Defense,Institute of Chemical Defense of PLA,Beijing 102205,China);The mistakes in EWB[J];Experimental Technology and Management;2007-02 |
8 |
CHENG Xiao-jie, FENG Quan-yuan(Microelectronics Institute, Southwest Jiaotong University, Chengdu 610031 China);A Low-Power High Reliability CMOS Current Limit Circuit[J];Microelectronics & Computer;2006-01 |
9 |
WU Xiao-ying,ZHANG Wan-jun,DU En-xiang,YANG Jun(The Academy Armored Forces Engineering of PLA,Department of Arms Engineering,Beijing 100072,China);Fuze Safety Distance Testing Method Based on Electromagnetic Induction of Coil Target[J];Journal of Detection & Control;2009-03 |
10 |
KANG Zhan-cheng1,2(1.School of Physics and Electronics Engineering,Shanxi University ,Taiyuan Shanxi,030006;2.School of Physics and Electronics Science,Shanxi Datong University,Datong Shanxi 037009);On Fault Diagnostic Methods of Analog Circuit[J];Journal of Shanxi Datong University(Natural Science);2007-04 |
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