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《Research and Exploration in Laboratory》 2010-04
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Design of MCU Automatic Test System

WANG Xiao-li,DONG Xiao-zhou(School of Information Engineering,Shandong University at Weihai,Weihai 264209,China)  
The controllable core of this system,which can automatically detect the problems of MCU,is the complex programmable logic devices(CPLD).This system is composed mainly of the control module of CPLD,the module of parallel download,serial transceiver.First,the automatic system detects the signal when the download of MCU is completed,CPLD communicates with MCU in an asynchronous receiver.After this CPLD analyses the data which was written and then read from MCU,so comes to the conclusion of the working conditions of serial communication.Finally,the GPIO of MCU are tested.All of these tests can be shown by LED,and then be clearly known to user.Compared with the traditional detection technology this system has high degree of automation,high detection rate and low test time.
【Fund】: 山东大学威海分校科研基金项目(1050432120608)
【CateGory Index】: TP274
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