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《Electronic Test》 2014-01
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RFID IC Test System Based on Virtual Instrumentation

Liu Chunlai;Zhang Dong;Zhao Yongfeng;Beijing Institute of Auto-Testing Technology;  
This paper studied a RFID IC test system based on virtual instrumentation.Through custom software and using modular instruments high degree of flexibility,RFID IC test system could complete functional testing for RFID chip.With the same hardware configuration in the software layer of RFID standards support,we use the same test system hardware can be testing different standards of RFID tags.
【Fund】: “北京市财政资金项目“创新工程Ⅱ-2:面向物联网的超高频RFID芯片测试技术研究支持”(项目编号:PXM2013_178102_000003)
【CateGory Index】: TP391.44;TP274
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