Full-Text Search:
Home|About CNKI|User Service|中文
Add to Favorite Get Latest Update

Effects of Cl,Br,I Dopants on the Xerographic Residual Potential of As_5Se_(95) Film

Zhang Gancheng Zhang Fuzhen Min Sigui (Shanghai Institute of Ceramics,Academia Sinica)  
The method of xerographic spectrum analysis has been used for studying the effectsof Cl,Br,I dopants in As_5Se_(95)film.The experimental results are as follows:1.Cl,Br,I dopants in As_5Se_(95) film can decrease the residual potential.The decreasemagnitude is in the order of IBrCl.2.The average carrier drift length μτ is in the order of IBrCl.3.The integrated density of deep traps and their release life time show that thedoped halogen can compensate some of the deep hole traps.
Download(CAJ format) Download(PDF format)
CAJViewer7.0 supports all the CNKI file formats; AdobeReader only supports the PDF format.
©CNKI All Rights Reserved