Full-Text Search:
Home|Journal Papers|About CNKI|User Service|FAQ|Contact Us|中文
《Engineering Journal of Wuhan University》 2017-02
Add to Favorite Get Latest Update

An improved two-dimensional micro-displacement sensor system based on techniques of CMOS image sensor and equal-inclination interference

ZHOU Guoquan;ZHOU Yibo;School of Physics and Technology,Wuhan University;  
Based on the principle of equal-inclination interference and the technique of complementary metal-oxide-semiconductor(CMOS)image sensor,an improved two-dimensional(2D)micro-displacement sensor system is designed.Instead of the existing charge coupled device(CCD),the CMOS image-sensor chips are used in the new sensing system,which can change the photo signals into the electrical signals.Subsequently the electrical signals are processed by a field programmable gate array(FPGA)chip,transferred to a computer system,and finally displayed real-timely on the LabView platform.A high measurement sensitivity,up to the level of 0.1-1μm,can be achieved.This system can be widely applied to many fields,such as monitoring the safety of key water conservancy projects and large buildings,and the realtime control of 2D micro-displacement in precision machining.
【Fund】: 高校教指委教研项目(编号:JZW-16-DD-15)
【CateGory Index】: TP212
Download(CAJ format) Download(PDF format)
CAJViewer7.0 supports all the CNKI file formats; AdobeReader only supports the PDF format.
©2006 Tsinghua Tongfang Knowledge Network Technology Co., Ltd.(Beijing)(TTKN) All rights reserved