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IC manufacturability design foundation and statistical optimization method

Hao Yue  
Based on the basic conception of IC manufacturability design, maximum parameter yield, optimal design tolerancing and tuning, as well as minimum manufacture cost are con- sidered during the IC manufacture and process. A unified DCTT model is proposed which is based on the frame of non-differentiable programming. The model can include the avail- able basic models of detcrministic statistical optimization, and open a new path for the fur- ther development of the statistical optimization method.
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