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A planar near field scanning technique and its measuring system

Zhang Shixuan Yan Zehong Fu Demin Mao Naihong (Research Inst. of Antennas and Electromagnetic Scattering, Xidian Univ., Xian, 710071)  
The principle of planar near field scanning is described briefly. A measuring system is developed successfully in the light of this principle, which can accomplish planar, cylindrical, spherical and palar planar near field scanning, near field to far field transformation, data analysis and various terminal treatments.
【Fund】: “八五”国防预研项目
【CateGory Index】: TN820.1
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Chinese Journal Full-text Database 4 Hits
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