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《Journal of Xiamen University(Natural Science)》 2010-01
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Analysis of Multi-classification Based on SVM in Different Feature Space

ZHOU Qi-feng,HONG Wei-cai,SHAO Gui-fang (School of Information Science and Technology,Xiamen University,Xiamen 361005,China)  
There usually using the same kernel parameter in multi-classification methods based on SVM such as one versus one(1-v- 1)and one versus rest(1-v-r).Optimizing each sub-classifier under different kernel parameter is equal to classifying in different feature space.Then the comparability of each sub-classifier's output should be analyzed before using the MaxWin strategy directly.In this paper, a relative margin is introduced to analyse the outputs of sub-classifiers.Results show that using different kernel parameters to optimizing each sub-classifier respectively,the outputs of decision function are still comparablk,and furthermore,it performs the better generalization ability.
【Fund】: 福建省自然科学基金(2009J05153)
【CateGory Index】: TP18
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【Co-references】
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1 LIU Li-hong~1,HU Ke-gang~1,LIU Li-xin~2 (1College of Communication Engineering, Jilin University,Changchun 130012, China; 2College of Optic-electroric Engineering,Changchun University of Science and Technology,Changchun 130022, China);Fast median filtering algorithm in target detection[J];Journal of Changchun Post and Telecommunication Institute;2004-03
2 Yang Zhi -ming 1, Zhou Qi -guo 2 (1 Chongqing Polytechnic College, Chongqing, 400050; 2 Chongqing University, Chongqing, 40044);The recognition the geometric figure based on the Hough transformation theory[J];Journal of Chongqing Polytechnic College;2002-04
3 LIU Yong-lu1,SHAO Long-tan2(1.Dalian Naval Academy,Dalian 116018,China;2.Dalian University of Technology,Dalian 116023,China);An Approach of Recognition in High Precision Based on the Contour Feature Points[J];Computer and Information Technology;2009-03
4 He Jun Liao Liangsheng Zhou Xiang Miao Xiyue Xiong Zuhong Hou Xiaoyuan(State Key Laboratory of Surface Physics, Fudan University, Shanghai 200433);DYNAMIC OBSERVATION AND ANALYSIS OF FAILURE PROCESS OF ORGANIC THIN FILMELECTROLUMINESCENCE DEVICES[J];CHINESE JOURNAL OF LUMINESCENCE;1998-02
5 LI Jian-feng1,2,GUO Yong-kang1,Wang Peng1,2,ZHU Jian-hua1,TANG Qin1,2(1 Nano Photonics Research Technology Institute of Sichuan University,Chendu 610064,China)(2 XinAoMDT Technology Co.,Ltd,Langfang,Shandong 065001,China);Modification of RAC Camera Calibration Method Based on Large Depth-of-view 3D Laser Scanner[J];Acta Photonica Sinica;2008-02
6 Fan Xiaotao Xia Yuren(Shanghai Jiaotong University,Shanghai200030);The Algorithmic Research of Digital Image Process in Detection of PCB Board[J];Computer Engineering and Applications;2004-13
7 LI Qingfeng1,FU Zhongliang1,LIU Qin2(1.Institute of Computer Applications,Chinese Academy of Sciences,Chengdu 610041;2.Dept.of Computer Science,Southeast University,Nanjing 210096);An Effective Skew Image Correction Method[J];Computer Engineering;2006-21
8 DENG Wan-Yu1)ZHENG Qing-Hua1)CHEN Lin2)XU Xue-Bin1)1)(Ministry of Education Key Laboratory for Intelligent Networks and Network Security,Department of Computer Science and Technology,Xi'an Jiaotong University,Xi'an 710049)2)(Department of Computer Science and Technology,Xi'an University of Posts & Telecommunications,Xi'an 710121);Research on Extreme Learning of Neural Networks[J];Chinese Journal of Computers;2010-02
9 WU Wen-qi,SUN Zeng-qi (State Key Laboratory of Intelligent Technology & Systems,Dept.of Computer Science & Technology,Tsinghua University,Beijing 100084,China);Overview of Camera Calibration Methods for Machine Vision[J];Application Research of Computers;2004-02
10 ZHOU Mei-Juan,WANG Qiu-Yun,LUO Shi-Di,WU Zheng-lu (Zhanjiang Ocean University,Zhanjiang,Guangdong 524088,China);Heat effect of organic electroluminescence devices and analysis of the failure process[J];Laser Journal;2004-05
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