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Constant Stress Accelerated Life Test of White OLED Based on MAM

ZHANG Jian-ping1,LIU Yu2,CHENG Guo-liang3,ZHU Wen-qing3,LIU Fang1(1.School of Thermal Power and Environmental Engineering,Shanghai University of Electric Power, Shanghai 200090,China2.Chinese Academy of Sciences,Shanghai Institute of Ceramics,Shanghai 200050,China; 3.Shanghai Tianyi Electric CO.,LTD,Shanghai 201611,China; 4.Key Laboratory of Advanced Display and System Applications of EMC,Shanghai University, Shanghai 200072,China)  
In order to obtain the reliability life information of the white Organic Light-Emitting Diode(OLED) in a short time,failure data of OLED samples were collected by carrying out three groups of constant current stress accelerated life tests,and the lognormal distribution function was applied to describing the life distribution.The evolution of OLED's average life and the median life were achieved by applying the lognormal distribution to describing the life,and the self-developed life prediction software to plotting double coordinates' paper of lognormal probability,which based on map analysis method(MAM).Numerical results indicate that white OLED's life follows the lognormal distribution,that the acceleration model is consistent with inverse power law,and that the acceleration parameters which are accurately calculated make fast estimation of white OLED lifetime possible,which provides some significant guideline to its manufacturers and customers.
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