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《Instrument Standardization & Metrology》 2006-01
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Analysis and Design of Automatic Instruments for EMC

Wang Ying (Shanghai Institute of Process Automation Instrumentation, Shanghai 200233)  
The paper simply introduced the national standard of automatic instruments for EMC tests, and illustrated the reason that the instruments may be fail caused by interference during EMC test and gave some useful and effective EMC design methods for EMC problems.
【CateGory Index】: TP216
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