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In-situ LA-(MC)-ICPMS and (Nano) SIMS trace elements and sulfur isotope analyses on sulfides and application to confine metallogenic process of ore deposit

FAN HongRui;LI XingHui;ZUO YaBin;CHEN Lei;LIU Shang;HU FangFang;FENG Kai;Key Laboratory of Mineral Resources,Institute of Geology and Geophysics,Chinese Academy of Sciences;College of Earth and Planetary Sciences,University of Chinese Academy of Sciences;Institutions of Earth Science,Chinese Academy of Sciences;State Key Laboratory of Lithospheric Evolution,Institute of Geology and Geophysics,Chinese Academy of Sciences;  
In-situ micro-analyses on sulfides currently include LA-ICPMS spot analysis,LA-ICPMS and( Nano) SIMS mapping of trace elements,in-situ sulfur isotope spot analysis and mapping by SIMS,Nano SIMS,as well as LA-MC-ICPMS. Those analytical methods can effectively obtain the contents and abundance maps of trace elements,sulfur isotopic ratios and distribution in sulfides at different stages,which combined with time-resolved spectra data and analysis of trace element correlations have significant implications on the research of fine metallogenic process. The analytical results are essential for the understanding of the behavior and occurrence of metallogenic elements,element substitution,source of ore-forming fluids and sulfur,chemical banding of ore mineral and genetic model of ore deposit. During in-situ trace elemental and isotopic analyses on sulfides by LA-ICPMS,LA-MC-ICPMS,SIMS and Nano SIMS,it is necessary to reduce the systematic error of instrument and analytical method,and overcome the potential matrix effect and isotope fractionation.
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