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《Journal of Zhejiang University(Natural Science)》 1992-01
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Properties of metal-thin film-metal capacitor

Xu Jingjiang(Dept. of Opt. Engineering)  
The capacitance, loss-tangent and breakdown character of metal-thin film-metal capacitor have been examined and those electronic properties have been explaned. The dielectric meterial used in this paper are evaporated ZnS、SiO2 films and arachidic acid films prepared by using the LB (Langmuir-Blodgett) technique. Experiment evidence confirmed that all the electronic properties of metal-LB organic film-metal capacitor discussed in this paper are much better than those of ZnS and SiO2 capacitor
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1 CHEN DOU-NAN LIU BAI-YONG ZHENG XUE-REN (Department of Physics, South China University of Technology, Guangzhou);STUDY ON THE BREAKDOWN MECHANISM OF A THIN Si_xO_yN_z FILM[J];Acta Physica Sinica;1989-01
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