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Journal of Chinese Electron Microscopy Society
FQ: 双月
AD of Publication: 北京市
Lanuage: 中文;
ISSN: 1000-6281
CN: 11-2295/TN
YP: 1982
Url: 中国物理学会
Recommended Journals
Journal of Chinese Electron Microscopy Society
2016 -01
Effect of pH value on the DNA charge inversion and aggregation state during the interaction between DNA and chitosan XIANG Dong-fang;WANG Lu;CHEN Lu-fei;JIN Xian-jun;WANG Yan-wei;School of Physics and Electronic Information
Characterization of several pinus species pollens via different treatments by SEM ZHANG Guo-yun;ZHANG Wen-ting;YAO Juan-ni;PEI Guo-liang;State Key Laboratory of Crop Stress Biology in Arid Areas
Status of gold and silver minerals in the Chen'er gold deposit in Shanxi Province ZHANG Zhen-hua;YIN Jing-wu;CHEN Pu-pu;WANG Meng-ya;ZHAO Fei;SUN Yan-dong;ZHANG Piao;ZHANG Xu-dong;Institute of Earth Science
The application of argon ion polishing-field emission scanning electron microscopy to the research on coal nanopores MAO Xiao-xiao;ZHAO Di-fei;LU Chen-gang;LI Gang;GUO Xiao-yu;GUO Ying-hai;School of Resources and Earth Science
Applications of FIB technique in the preparation of HRTEM samples for diamond/M( M = Cu,Al,Al N)composite materials QIAO Yi;LI Jian-wei;LIU Gang;ZHANG Yang;CHEN Liang-xian;SHI Wei;YAN Qin-fang;ZHANG Hai-long;State Key Laboratory for Advanced Metals and Materials
Drawbacks in the focused ion beam processing and the causes LUO Qiang;International Center for Quantum Materials
Simulations of the parameters in the focused ion beam implanted different materials JIA Rui-li;XU Zong-wei;WANG Qian-jin;State Key Laboratory of Precision Measuring Technology & Instruments
Preparation of ultrathin TEM sample by focused ion beam technique—the application of X~2 sample holder JIA Jia-qi;XING Yuan;SHI Wei;JIA Zhi-hong;College of Materials Science and Engineering
Application of FIB / SEM dual beam system in the testing of the electrical properties of micro / nanomaterials PENG Kai-wu;National Center for Nanoscience and Technology;
Study on the orientation-dependent grain growth of high purity tantalum LIU Ya-hui;LIU Shi-feng;FAN Hai-yang;LIU Qing;College of Materials Science and Engineering
The impact on properties of AZ31 magnesium alloy in different direction during high cycle fatigue process TAN Li;ZHANG Xi-yan;YIN Rui-sen;YU Jiang-ping;SHU Yang;LIU Qing;School of Material Science and Engineering
The investigation of near-surface magnetic force microscopy LI Zheng-hua;MA Xiao-li;LI Xiang;School of Physics and Materials Engineering
Preparation of tips for scanning tunneling microscopy by optimized difference method ZANG Kan;HOU Bin-bin;YOU yan;XUE Dong-dong;JIN Yan;ZHAO Chen;ZHU Xiao-hong;DONG Hua-jun;GUO Fang-zhun;GU Qiang;Dalian Jiaotong University;Dalian Dadian Technology Co.
FIB-SEM dual-beam system and its partial applications FU Qin-qin;SHAN Zhi-wei;CAMP-Nano
Observation of cellular ultrastructure and subcellular localization of ABP1 in seed coat of peach fruit LAN Miao;YANG Rui;HU Xiao;HOU Xu;LIU Yue-ping;College of Biological Science and Engineering
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