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Journal of China University of Metrology
FQ: quarterly
AD of Publication: China
Lanuage: English
ISSN: 1004-1540
CN: 33-1147/C
YP: 1990
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Journal of China University of Metrology
1990 -00
Laser Enhanced Ionization Spectrometry and Sensitive Detection of Ⅲ A Series Elements Ga, In, TI Zhang Zaixuan;Wang Ling;Fang Xiao, Speciality of Optical MeasurementsYuan Yeqian;Chen Junde, Laser Spectroscopy Public Laboratory, Academia Sinica, Hefei
Application of Spatial Perspective Affine Transformation in the Orthographic Projection Hua Zhong, Division of engineering grahigs
A Simple and Practical learning and developing Device of Chip-Microprocessor——Using ICC industrial control board-microcomputer to develop 8031 chip-microprocessor of MCS-51 series Guo Baohua;Wei li, Division of Radio Metrology
1990 Issues:  [00]
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