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Semiconductor Technology
FQ: 月刊
AD of Publication: 河北省石家庄市
Lanuage: 中文;
ISSN: 1003-353X
CN: 13-1109/TN
YP: 1976
Url: 中国半导体行业协会;半导体专业情报网;中国电子科技集团公司第十三所
Recommended Journals
Semiconductor Technology
2018 -04
Catalog
Current Research Status and Development Trends of Ga_2O_3 Power Device Sun Xuegeng;Zhang Zhiqun;Xiamen Ocean Vocational College;Fujian Polytechnic of Information Technology;
A Broadband Multifunctional Transceiver Circuit Using Current Reuse Topology Fang Yuan;Gao Xuebang;Han Qin;Liu Huidong;The 13th Research Institute
Design of X-Band GaN-Based Small Phase Shifters Liu Hui;Sun Pengpeng;Zhang Zongjing;Luo Weijun;Institute of Microelectronics
Design of a Low Conversion Loss Mixer with Integrated Driving Amplifier Yang Li;Li Weimin;Zhang Dianwei;Duan Chong;Beijing Microelectronics Technology Institute;
Development of 1 200 V/100 A High Temperature High Current 4H-SiC JBS Diodes Tang Yidan;Li Chengzhan;Shi Jingjing;Bai Yun;Dong Shengxu;Peng Zhaoyang;Wang Yiyu;Liu Xinyu;High-Frequency High-Voltage Devices and Integrated Circuits R&D Center
di/dt Optimization of the Metal Oxide Semiconductor Controlled Thyristor Hu Fei;Song Limei;Han Zhengsheng;Institute of Microelectronics
10 Gbit/s Mesa InGaAs/InP pin High Speed Photodetector Li Qingwei;Li Wei;Qi Lifang;Yin Shunzheng;Zhang Shizu;The 13th Research Institute
Study on Post Deposition Annealing Process of the High-k HfO_2 Gate Dielectric Liu Qianqian;Wei Shuhua;Yang Hong;Zhang Jing;Yan Jiang;School of Electronic Information Engineering
Effect and Mechanism of BTA Removal by Alkaline Polyhydroxy Polyamines Chelating Agent After Cu CMP Gao Baohong;Tan Baimei;Che Jiamang;Liu Yilin;Yang Liu;Liu Yuling;School of Electronic Information Engineering
Preparation Technology of Dry Etching for Nanorod InGaN/GaN Multiple Quantum Wells Yan Xiaomi;Jiang Hongling;Jia Meilin;Jiangsu Xinguanglian Semiconductor Co.
Growth of High Quality AlGaN/GaN HEMT Structures on 8-inch Si Substrates Chen Zhen;Zhou Mingbing;Fu Yi;Latticepower Jiangxi Corporation;
Effect of Etchant Solution on Graphene Transfer Quality and GFETs Performance Jiang Yue;Peng Dongsheng;Chen Zujun;Zhang Maoxian;Peng Zhengchun;Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province
Failure Analysis Technology for High Density Packaging and Its Application Liu Xiaoyu;Chen Yanning;Li Jianqiang;Qiao Yanbin;Ma Qiang;Shan Shushan;Zhang Haifeng;Tang Xiaoke;State Grid Key Laboratory of Power Industrial Chip Design and Analysis Technology
Design Technique of a SIP Test and Debugging System Based on JTAG Interface Yang Liang;Yu Zongguang;Wei Jinghe;The 58th Research Institute
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