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Micronanoelectronic Technology
FQ: monthly
AD of Publication: China
Lanuage: English
ISSN: 1671-4776
CN: 13-1314/TN
YP: 1964
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Micronanoelectronic Technology
2017 -02
Synthesis of the Tin Oxide Nanosphere and Its Gas-Sensing Properties to Hydrogen Wang Ying;Yang Jie;Wang Xiu;Hu Jie;Micro and Nano System Research Center
Influence of the Au Catalyst Rapidly Annealed at Different Temperatures on β-Ga_2O_3 Nanowire Arrays Cao Yisen;Deng Jinxiang;Cui Min;Kong Le;Chen Liang;Shen Zhen;College of Applied Sciences
Surface Light Trapping Structure Based on ReactionDiffusion Etching for Solar Cells Zhao Zhouxing;Wang Qingkang;Liu Daiming;Key Laboratory for Thin Film and Microfabrication Technology of Ministry of Education
Homoepitaxy Technology Based on the 4H-SiC Piezoresistor Sun Yanan;Shi Yunbo;Feng Hengzhen;Wang Hua;Han Xingyu;Science and Technology on Electronic Test and Measurement Laboratory
Single-Event Burnout Effect of 4H-SiC and 6H-SiC Power VDMOSFETs Liu Zhongyong;Cai Li;Liu Xiaoqiang;Liu Baojun;Cui Huanqing;Yang Xiaokuo;Science College
Sensitive Characteristics of the Sensitive Devices Prepared by WO_3 and CH_3NH_3PbI_3 Perovskite Jin Huijiao;Li Yan;Zeng Yan;Hua Zhongqiu;Tian Hanmin;School of Electronic Information Engineering
Stability of the Abrasive in the Alkaline Slurry for the GLSI Copper Wiring Zhao Yadong;Liu Yuling;Luan Xiaodong;Yan Chenqi;Wang Zhongjie;School of Electronic Information Engineering
Al Ion Implantation Technology for 4H-SiC at Room Temperature Wang Dongyu;Lin Wenkui;Zeng Chunhong;Sun Yuhua;Ju Tao;Zhang Baoshun;Zhang Xinping;School of Material Science and Engineering
Growth of the Selective Epitaxial Ge Film on Si-Based Substrates Wu Xipeng;Wang Guilei;Li Zhihua;Tang Bo;Zhang Qingzhu;Wu Cinan;Yan Jiang;College of Big Data and Information Engineering
Two-Step Calibration Method Based on the MIMU Measurement System Liu Zhiwen;Zhang Xiaoming;Ma Xihong;Science and Technology on Electronic Test and Measurement Laboratory
Performance Optimization and Design of the LC Temperature Sensor at High Temperature Tang Shun;Tan Qiulin;Wang Haixing;Song Ruijia;Wu Guozhu;Xiong Jijun;Science and Technology on Electronic Test and Measurement Laboratory
2017 Issues:  [01] [02] [03] [04] [05] [06] [07] [08] [09] [10]
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