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Electronic Product Reliability and Environmental Testing
FQ: 双月
AD of Publication: 广东省广州市
Lanuage: 中文;
ISSN: 1672-5468
CN: 44-1412/TN
YP: 1980
Url: 工业和信息化部电子第五研究所
Recommended Journals
Electronic Product Reliability and Environmental Testing
1999 -02
Catalog
Application Investigation in the Reliability Evaluation Method of Vacuum Electron Display devices(CRT) Su Zhenhua Lin Jiang (NO 5 Research Institute,Ministry of Electronics Industry,GuangZhou 510610) Wu Boxiang (Huadong(East-China)Electron Tube Factory Nanjing 210028)
The Software Exploitation of Reliability Parameter Design in Circuit Design Xu Jing Huang Xiping Zhang Yikun Xu Ping Automation and Information Engineering School of Xi’an University of Technology Lu Jianguo
1999 Issues:  [02] [03] [04]
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