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Opto-Electronic Engineering
FQ: monthly
AD of Publication: China
Lanuage: English
ISSN: 1003-501X
CN: 51-1346/O4
YP: 1974
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Opto-Electronic Engineering
2016 -01
Catalog
Tunable Broadband Absorber in Terahertz Regime Based on Graphene and Metallic Sub-wavelength Structure GU Yu;WANG Min;PU Mingbo;HU Chenggang;LUO Xiangang;State Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering
Method to Fabricate Subwavelength Grating Based on Thiol-ene ZHANG Man;DENG Qiling;LI Zhiwei;PANG Hui;SHI Lifang;CAO A′xiu;HU Song;Institute of Optics and Electronics
Method Investigation of Direct-writing Nanolithography Based on Enhanced Local Surface Plasmon Resonance WANG Yaohui;HE Jiayu;WANG Changtao;YAO Na;LUO Xiangang;State Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering
Near Infrared Reflective Shearing Point Diffraction Interferometer WAN Jun;CHEN Lei;ZHU Wenhua;LI Jinpeng;School of Electronic and Optical Engineering
All-reflective Broadband Spectroscopic Imaging Ellipsometer JIANG Chunguang;CHEN Yaqin;LIU Tao;XIONG Wei;LI Guoguang;JI Feng;School of Instrumentation Science and Opto-electronics Engineering
Measurement Accuracy Analysis of Double-V Shaped Six-light-screen Array CHEN Rui;NI Jinping;HU Xu;School of Optoelectronic Engineering
The Quantitative Classification of Corona Discharge Intensity of UV Detection MA Lixin;ZHOU Xiaobo;ZHU Run;SHAN Yu;Department of Electrical Engineering School of Optical-Electrical and Computer Engineering
Tunable THz Filter Based on Double Split-ring Resonator with Flexible Cantilever ZHANG Junnan;LI Xiong;ZHANG Tiejun;ZHAO Zeyu;LUO Xiangang;State Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering
A Method of Symptotic Corner Detection Based on Prior Information WANG Zhong;LIU Wenjing;FU Luhua;GUO Youwei;State Key Laboratory of Precision Measuring Technology and Instruments
A Measurement Method for Glare Based on the Optical Modulation System before Image Formation ZHAO Shoubo;QU Xinghua;FENG Wei;CHEN Zhe;ZHENG Shiwei;The State Key Lab of Precision Measuring Technology & Instruments
Measurement System of Inclination Angle Based on Laser Triangulation ZHANG Jinfeng;ZHANG Jiye;Traction Power State Key Laboratory
A Region-growing Phase Unwrapping Algorithm Based on a New Quality-guided Map LIU Ying;ZHANG Ruifeng;CHEN Xiangzhou;LI Qiang;JI Xin;WANG Yang;School of Electronic Information Engineering
A Vehicle Outer Contour Dimension Measuring Method Based on Computer Vision Technology LIANG Chunjiang;DUAN Fajie;YANG Yi;LI Yang;XU Fei;State Key Laboratory of Precision Measuring Technology & Instruments
An Encryption Method Based on Diffraction Imaging Principle and Phase Mask Removal Method GONG Qiong;WANG Zhipeng;YANG Xingqiang;ZHANG Ping;CUI Mingyue;QIN Yi;College of Physics and Electronic Engineering
Error Analysis for the MTF Rapidly Inspecting Method of Near-to-eye Display Optical System SUN Qi;QIU Chuankai;YANG Huan;YANG Xiaojun;State Key Laboratory of Optical Technologies for Nano-Fabrication & Micro-Engineering
Terahertz Sensing Chip of Sub-wavelength Metallic Arrays WANG Sijiang;MAO Hongyan;XIA Liangping;YANG Zhongbo;WEI Dongshan;CUI Hongliang;DU Chunlei;Chongqing Key Laboratory of Multi-Scale Manufacturing Technology
2016 Issues:  [01] [02] [03] [04] [05] [06] [07] [08] [09] [10] [12] [11]
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