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Microelectronics
FQ: 双月
AD of Publication: 重庆市
Lanuage: 中文;
ISSN: 1004-3365
CN: 50-1090/TN
YP: 1971
Url: 四川固体电路研究所
Recommended Journals
Microelectronics
2011 -01
Catalog
An LDO Linear Regulator Based on Dynamic Leaker of Load Current QIN Lulin1,CHEN Hong1,ZHANG Wandong1,DENG Chunjian2,NING Ning1,WANG Xiangzhan1,YU Qi1(1.State Key Lab.of Electronic Thin Films and Integrated Devices,University of Electronic Science & Technology of China,Chengdu 610054,P.R.China;2.Zhongshan Institute,University of Electronic Science and Technology of China,Zhongshan,Guangdong 528402,P.R.China)
LDO Linear Regulator with High Stability Based on Full Feedback ZHANG Tisheng,JIANG Jinguang,LIU Jingnan(Research Center of GNSS,Wuhan University,Wuhan 430079,P.R.China)
Design of Compensation to Improve Loading Capacity of Buck DC-DC Converters LI Xin,LU Ting,JING Xin(Shenyang University of Technology,Shenyang 110870,P.R.China)
Design of Step-Down Regulator Circuit with Wide Input Voltage LIU Hao1,CHEN Zhi1,GE Jiale1,YU Qi1,NING Ning1,WANG Xiangzhan1,DENG Chunjian2,LI Jingchun1 (1.State Key Lab.of Elec.Thin Films and Integrated Devices,Univ.of Elec.Sci.& Technol.of China,Chengdu 610054,P.R.China;2.Zhongshan Institute,Univ.of Electronic Science and Technology of China,Zhongshan,Guangdong 528402,P.R.China)
Design of LED Linear Current Driver for Backlight of Automobile Panel LI Longzhen1,REN Zhengquan1,HA Pan-Bong2,KIM Young-Hee2(1.Dept.of Computer Science and Technology,Yanbian University,Yanji,Jilin 133002,P.R.China;2.Dept.of Elec.Engineer.,Changwon Naional University.,Changwon 641-773,Korea)
Design of a Multi-Mode and High Stability Charger for Li-Ion Battery JIN Huizhen,JIANG Yanfeng (College of Information Engineering,North China University of Technology,Beijing 100144,P.R.China)
A Decimation Filter for Digital Down-Conversion LAN Jinbao1,WANG Na2,ZHANG Ruitao3,LIU Lintao3,LI Ruzhang3(1.Sichuan Institute of Solid-State Circuits,China Electronics Technology Group Corp.,Chongqing 400060,P.R.China;2.Patent Examination Cooperation Center of SIPO,Beijing 100190,P.R.China;3.Science and Technology on Analog Integrated Circuit Laboratory,Chongqing 400060,P.R.China)
Design of Low Noise Amplifier with Shunt Feedback for 3-5 GHz UWB Receiver WANG Wei,PENG Neng,WANG Ying,HAN Bing,TANG Zhengwei,RUAN Wei,ZHOU Qianneng(College of Electronics Engineering,Chongqing University of Posts and Telecommunications,Chongqing 400065,P.R.China)
A Novel Frequency Compensation Structure for Rail-to-Rail Operational Amplifier CHEN Hong1,ZENG Lingyu1,HU Qiao1,YU Qi1,NING Ning1,WANG Xiangzhan1,DENG Chunjian2(1.State Key Lab of Electronic Thin Films and Integrated Devices,Univ.of Electronic Science & Technology of China,Chengdu 610054,P.R.China;2.Zhongshan Institute,Univ.of Electronic Science & Technology,Zhongshan,Guangdong 528402,P.R.China)
Design of High Performance CMOS Operational Amplifier WANG Haode,WANG Yongshun,SHI Lin,JING Li,ZHAO Wenhao(School of Electronic and Information Engineering,Lanzhou Jiaotong University,Lanzhou 730070,P.R.China)
A Low Power Programmable Gain Amplifier with DC-Offset Correction LIU Chang,GUO Guiliang,DU Zhankun,YAN Yuepeng(Dept.of Electronics System Technology,Institute of Microelectronics,The Chinese Academy of Sciences,Beijing 100029,P.R.China)
A Design Methodology of Operational Amplifier for Σ-Δ A/D Converter CHEN Yixu1,2,LI Ruzhang2,,SHI Lichun2,3(1.Chongqing University of Posts and Telecommunications,Chongqing 400065,P.R.China;2.Science and Technology on Analog Integrated Circuit Laboratory,Chongqing 400060,P.R.China;3.Xi'an Communication Institute,Xi'an 710106,P.R.China)
A 0.18 μm Low-Voltage and High-Speed Integrated Op-Amp with High PSRR ZHAO Qiuming,ZHAO Mingjian,WANG Weidong(Guilin University of Electronic Technology,Guilin,Guangxi 541004,P.R.China)
Theory of True Logarithmic Amplifier and Analysis of Its Characteristics LU Yi,HE Weiguo(Southwest Institute of Electronic Equipments,China Electronics Technology Group Corp.,Chengdu 610036,P.R.China)
Higher-Order Curvature-Compensated Bandgap Voltage Reference with High PSRR ZHANG Wandong,CHEN Hong,WANG Yipeng,YU Qi,NING Ning,WANG Xiangzhan(State Key Lab of Electronic Thin Films and Integrated Devices,Univ.of Elec.Sci.& Technol.of China,Chengdu 610054,P.R.China)
A Low Cost Primary Control AC-DC Charger OU Xuechun,MING Xin,LIU Mingliang,ZHOU Zekun,ZHANG Bo(State Key Lab of Electronic Thin Films and Integrated Device,Univ.of Electronic Science & Technology of China,Chengdu 610054,P.R.China)
A Current-Mode Piecewise Compensated Voltage Reference Source ZHONG Bo,SONG Xiaozhen,DUAN Shuangliang,ZHANG Bo(State Key Lab.of Elec.Thin Films and Integr.Dev.,Univ.of Elec.Sci.& Technol.of China,Chengdu 610054,P.R.China)
Clock Bootstrapping Circuit for High-Speed/High-Accuracy A/D Converter LIU Tao1,WANG Yuxin2,YU Jinshan2,3,LI Ting2,WANG Yan1,LIU Lu1(1.Sichuan Institute of Solid-State Circuits,CETC,Chongqing 400060,P.R.China;2.Sci.and Technol.on Ana.Integr.Circ.Lab.,Chongqing 400060,P.R.China;3.National Univ.of Defense Technology,Changsha 410073,P.R.China)
A High-Speed and Low-Voltage Differential Signaling Driver ZHANG Jun'an1,YANG Yujun2,YU Zhou1,ZHANG Ruitao1,FU Dongbing1,YU Jinshan1,3(1.Science and Technology on Analog Integrated Circuit Laboratory,Chongqing 400060,P.R.China;2.Sichuan Institute of Solid-State Circuits,China Electronics Technology Group Corp.,Chongqing 400060,P.R.China;3.National University of Defense Technology,Changsha 410073,P.R.China)
Design of a Charge Pump for AMOLED Display Driver IC WANG Yipeng1,ZHANG Wandong1,ZENG Lingyu1,DENG Chunjian2NING Ning1,YU Qi1,WANG Xiangzhan1,LI Jingchun1(1.State Key Lab.of Elec.Thin Films and Integrated Devices,Univ.of Electronic Science & Technology of China,Chengdu 610054;2.Zhongshan Institute,Univ.of Electronic Science & Technology of China,Zhongshan,Guangdong 528402,P.R.China)
Frequency Jittering Oscillator for LED Lighting Drive SONG Xiaozhen,ZHONG Bo,ZHANG Bo(State Key Lab.of Elec.Thin Films and Integr.Dev.,Univ.of Elec.Sci.& Technol.of China,Chengdu 610054,P.R.China)
Design of a High Precision and High Stability Oscillator CHEN Jianli,FU Jin,ZHU Peisheng,ZHANG Bo(State Key Lab of Electronic Thin Films and Integrated Device,Univ.of Electronic Science & Technology of China,Chengdu 610054,P.R.China)
Reliability Techniques for Hybrid Integrated Circuits LUO Jun,QIN Guolin,LI Xiaohong,DENG Yongfang,XING Zongfeng(Sichuan Institute of Solid-State Circuits,China Electronics Technology Group Corporation,Chongqing 400060,P.R.China)
Semi-Analytical/Semi-Numerical Analysis and Computation of OLED Dark Spot Diffusion Model in Matlab WANG Yifeng,TANG Libin,Yue Qing(Kunming Institute of Physics,Kunming 650223,P.R.China)
Study on Methodology of Building Thermal Resistor Network Model for Packaged Component HE Wei1,DU Ping'an1,XIA Hanliang2(1.School of Mechatronics Engineering,University of Electronic Science and Technology of China,Chengdu 611731,P.R.China;2.Karrie Technologies Company Ltd.,Dongguan,Guangdong 523709,P.R.China)
Total Dose Irradiation Effects of CMOS SRAM Under Different Bias Conditions LI Maoshun1,2,3,YU Xuefeng1,2,REN Diyuan1,2,GUO Qi1,2,LI Yudong1,2,GAO Bo1,2,3,CUI Jiangwei1,2,3,LAN Bo1,2,3,FEI Wuxiong1,2,3,CHEN Rui1,2,3,ZHAO Yun1,2,3(1.Xinjiang Technical Institute of Physics & Chemistry,The Chinese Academy of Sciences,Urumqi 830011,P.R.China; 2.Xinjiang Key Laboratory of Electronic Information Materials and Devices,Urumqi 830011,P.R.China;3.Graduate University of the Chinese Academy of Sciences,Beijing 100049,P.R.China)
Thermal Simulation and Analysis of IGBT Based on ANSYS ZHANG Jian,L Changzhi,ZHANG Xiaoling,XIE Xuesong,HUANG Yueqiang(School of Electronic Information and Control Engineering,Beijing University of Technology,Beijing 100124,P.R.China)
Effect of CMP on Reliability of Cu Interconnect Devices and Related Failure Analysis LIN Xiaoling1,2,LIU Jian2,Zhang Xiaowen2,HOU Tongxian1,YAO Ruohe1 (1.Institute of Microelectronics,School of Electronic and Information Engineering,South China Universityof Technology,Guangzhou 510640,P.R.China;2.National Key Laboratory of Science and Technology on Reliability Physics and Application of Electronic Component,China Electronic Product Reliability and Environmental Testing Research Institute,Guangzhou 510640,P.R.China)
Study on Temperature Properties of 4H-SiC Doubled-Floating Junction Schottky Barrier Diodes NAN Yagong,ZHANG Zhirong,ZHOU Zuo(Hexi University,Zhangye,Gansu 734000,P.R.China)
Modeling of Leakage Current in Amorphous Si Thin-Film Transistors LIU Yuan1,2,YAO Ruohe2,LI Bin2(1.Faculty of Materials and Energy,Guangdong University of Technology,Guangzhou 510006,P.R.China;2.School of Electronic and Information Engineering,South China University of Technology,Guangzhou 510640,P.R.China)
Design of Digital Interpolation Filter for Wideband Communications WANG Youhua1,LI Jiaoxue2,ZHANG Jun'an2,FU Dongbing2,YU Jinshan2,3(1.Sichuan Institute of Solid-State Circuits,China Electronics Technology Group Corp.,Chongqing 400060,P.R.China;2.Science and Technology on Analog Integrated Circuit Laboratory,Chongqing 400060,P.R.China;3.National University of Defense Technology,Changsha 410073,P.R.China)
Design of RC Time Constant Measuring Circuit in RF IC for GSM CHEN Xu,XU Feng,WANG Xin'an,HUANG Ru(Key Laboratory of Integrated Micro-system,Shenzhen Graduate School of Peking University,Shenzhen 518055,P.R.China)
Implementation of FME on Reconfigurable Processor ReMAP ZHANG Wenliang,YONG Shanshan,DAI Peng,WANG Xin'an,XIE Zheng(Key Laboratory of Integrated Microsystems,Shenzhen Graduate School of Peking University,Shenzhen,Guangdong 518055,P.R.China)
Design of Radiation Hardened SRAM Based on DICE ZHANG Lingyu,JIA Yuming,LI Lei,HU Minghao(Research Institute of Electronic Science and Technology,University of Electronic Science and Technology of China,Chengdu 610054,P.R.China)
Design of a 13.56 MHz Demodulator for RFID Interrogator Based on 0.5 μm CMOS Process DU Tao1,2,ZHU Hongwei1,DAI Qingyuan2(1.Huahong NEC Electronics Co.Ltd.,Shanghai 201206,P.R.China;2.Key Lab.for Thin Film and Microfabrication Technology of Ministry of Education;National Key Lab.of Nano/Micro Fabrication Technology,Shanghai Jiaotong University,Shanghai 200240,P.R.China)
Investigation into Device and Package Failure of Silicon-Based MEMS with Comb Structure CAI Wei1,LIN Zhoufeng1,2,LI Shaoping1,EN Yunfei1(1.National Key Laboratory for Reliability Physics and Its Application Technology of Electronic Component,China Electronic Product Reliability and Environmental Testing Research Institute,Guangzhou 510610,P.R.China;2.Key Laboratory of Special Function Materials under Ministry of Education,College of Materials Science and Engineering,South China University of Technology,Guangzhou 510640,P.R.China)
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