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Scintillator Materials Used for Ion Photon Emission Microscopy

LU Wenli;SUN Haohan;GUO Gang;CHEN Ya;ZHANG Yanwen;LIU Jiancheng;ZHONG Xiangli;Department of Nuclear Physics, China Institute of Atomic Energy;School of Material Science and Engineering, Xiangtan University;  
An ion induced photon emission microscopy(IPEM) optical imaging system is designed and built based on the devices of photon generation, photon transmission, and photon detection. The optical properties such as emission spectrum and attenuation time of various scintillator materials suitable for the system are tested. The spatial resolution of IPEM system is analyzed and compared when Cl ion beam with energy of 160 MeV is used to irradiate scintillator materials with different types and thicknesses. The results show that the spatial resolution of IPEM optical imaging system can reach 2.8 μm when ZnS(Ag) powder with thickness of 10 μm is selected as scintillator material. At the same time, the spatial resolution of the system can be improved by reducing the thickness of scintillator material.
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